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    • Home
    • About Us
      • Vision, Mission & Values
      • Milestones
      • Structure
      • Leadership
      • Sustainability
      • Awards & Certifications
    • Our Businesses
      • HDD Business Unit
      • PE Business Unit
    • Our Capabilities
      • Manufacturing
      • Design & Automation
      • Material & Process Lab
      • Quality Assurance
    • Investor Relations
      • Calendar
      • Financials
      • Announcements
      • Publications
      • Investor Relations Policy
  • Home
  • About Us
    • Vision, Mission & Values
    • Milestones
    • Structure
    • Leadership
    • Sustainability
    • Awards & Certifications
  • Our Businesses
    • HDD Business Unit
    • PE Business Unit
  • Our Capabilities
    • Manufacturing
    • Design & Automation
    • Material & Process Lab
    • Quality Assurance
  • Investor Relations
    • Calendar
    • Financials
    • Announcements
    • Publications
    • Investor Relations Policy

material & Process Lab

Liquid Particle Counter LPC (0.3um)

Measuring size and amount of particle on products by ultrasonic extraction in DI water.​


Support testing instrument:   

• LPC  Sensor PMS SO2 (for 0.2-2.0 um) / Sampler LS200​ 

• Ultrasonic Crest 132 KHZ​ 

SEM/EDX – Particle Analysis

Analyze particle element & structure through high imaging profiling.


Support testing instrument:  

• FE-SEM model Zeiss 

• Supra 40 with EDX Oxford 

• IE350 Plus ​XMAX 80 mm2​ 

 Ion Contamination Analysis

Analysis of anion and cation contamination by DI water extraction.​


Support testing instrument:
• Ion Chromatography model Dionex /ICS-2500​  

Fourier Transform Infrared Test (FTIR)

Use for analysis the organic compound on products such as Silicone, DOP, Amide and Hydrocarbon by solvent extraction.​ 


Support testing instrument:

• Fourier Transform Infrared Test (FTIR)model Thermo Nicolet 6700​

• Fume Hood  

Dynamic Head Space Outgassing Test (DHS)

Determine the organic compound that outgas by heating the sample at specific temperature and time.​


Support testing instrument:

• GC-MSD (Agilent 7890A GC with 5975C inert MSD )  Thermal Desorption System (Marks Unity II & Ultra II)​   

• Outgas sampling system (Oven & Chamber)​
Oven Mummer/Universal /UFB 500 (at least        10 °C above ​ ambient and  up to +220 °C) with flow controlling 6 channels ​- PTFE chamber with lids.  

Coordinate Measuring Machine (CMM)

Measurement range 

X Axis: 500 mm 

Y Axis: 400 mm 

Z Axis: 400 mm 

Resolution: 0.0001 mm  

Laser Micrometer

Measurement range: 0.3 to 30 mm

Measurement accuracy: +/- 2 um

Hardness Tester

Measurement Load

• Preload test force (N) 

• 98.07 (Rockwell) 

• 29.42 (Superficial Rockwell) 

• Load Test Force (N)  

• 588.4, 980.7, 1471 (Rockwell) 

• 147.1, 294.2, 441.3 (Superficial Rockwell)  

Marposs (Automatic Gauge)

• Non-destructive (ND) measurement

• Measurement accuracy: +/- 3 um   

Micro-Height Gauge

• Precision height measurement

• Range of application (mm): 520 

• Resolution (mm): 0.01 / 0.001 / 0.0001  

Smartscope 

• Automatic High-Speed Camera dimensional measurement 

• XYZ Range: 300x150x200 mm 

• XYZ Resolution: 0.1μm 

• Field of View: 5.0mm (low mag) to 0.9mm (high mag) 

• XY area accuracy: 1.8 + 6L/1000) μm 

• Z linear accuracy: 2.5 + 5L/1000) μm4 (with 2.0x lens attachment)  

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